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dc.contributor.advisorDonald Rosenfield and Duane S. Boning.en_US
dc.contributor.authorGan, Jyeh Jen_US
dc.contributor.otherLeaders for Manufacturing Program.en_US
dc.date.accessioned2007-11-15T21:35:25Z
dc.date.available2007-11-15T21:35:25Z
dc.date.copyright2007en_US
dc.date.issued2007en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/39488
dc.descriptionThesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; in conjunction with the Leaders for Manufacturing Program at MIT, 2007.en_US
dc.descriptionThis electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.en_US
dc.descriptionIncludes bibliographical references (p. 68-69).en_US
dc.description.abstractIntel® is a manufacturing company that concentrates on the fabrication process of computer chips. Over the years and into the future, Intel® has gone through multiple and advanced generations of manufacturing technology caused by new fabrication techniques and increased wafer sizes. These advances have resulted in significant opportunities for cost reduction which includes reuse of semiconductor equipment within Intel factories and sale of used semiconductor equipment. To ensure assets are transferred in a safe and timely manner, Intel developed a 6D program (Decontamination, Decommission, Demolition, Demolition-System, Delivery, and Deployment) to standardize the EOL (End of Life) process of transferring a tool from the factory to its final destination in reuse, sale, parts harvesting, donation or scrap. Like other multi-national companies, Intel® has decentralized manufacturing processes over multiple worldwide sites; most if not all the fabrication, sort, and assembly tool information is archived in multiple repositories/systems. In addition to the scattering of knowledge, the tool-related information appears not to be comprehensive, including data fields not matching across multiple systems.en_US
dc.description.abstract(cont.) As a result, significant time is consumed to ensure the comprehensiveness and the accuracy of the required data across the multiple sites. Thus a comprehensive map of information infrastructure based on the 6D process is necessary to understand and enhance efficiencies in the knowledge flow process. Detailed mapping of databases and their meta-data will help identify the thoroughness, accuracy, redundancy, and inefficiency in the tool-related information systems as they relate to 6D. A prototype of a "one-stop-site"was developed and key Knowledge Management recommendations were proposed to enhance efficiency by further reducing costs, time, and resources.en_US
dc.description.statementofresponsibilityby Jyeh J. Gan.en_US
dc.format.extent69 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectSloan School of Management.en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.subjectLeaders for Manufacturing Program.en_US
dc.titleDecision support systems for tool reuse and EOL processesen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.description.degreeM.B.A.en_US
dc.contributor.departmentLeaders for Manufacturing Program at MITen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.contributor.departmentSloan School of Management
dc.identifier.oclc175911466en_US


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