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dc.contributor.authorSoleymani, Ashkan
dc.contributor.authorPiliouras, Georgios
dc.contributor.authorFarina, Gabriele
dc.date.accessioned2026-01-22T15:27:08Z
dc.date.available2026-01-22T15:27:08Z
dc.date.issued2025-06-15
dc.identifier.isbn979-8-4007-1510-5
dc.identifier.urihttps://hdl.handle.net/1721.1/164613
dc.descriptionSTOC ’25, Prague, Czechiaen_US
dc.description.abstractWe establish the first uncoupled learning algorithm that attains O(n log2 d logT) per-player regret in multi-player general-sum games, where n is the number of players, d is the number of actions available to each player, and T is the number of repetitions of the game. Our results exponentially improve the dependence on d compared to the O(n  d logT) regret attainable by Log-Regularized Lifted Optimistic FTRL introduced by Farina, Anagnostides, Luo, Lee, Kroer, and Sandholm [2022], and also reduce the dependence on the number of iterations T from log4 T to logT compared to Optimistic Hedge, the previously well-studied algorithm with O(n logd log4 T) regret shown by Daskalakis, Fishelson, and Golowich [2021]. Our algorithm is obtained by combining the classic Optimistic Multiplicative Weights Update (OMWU) with an adaptive, non-monotonic learning rate that paces the learning process of the players, making them more cautious when their regret becomes too negative.en_US
dc.publisherACM|Proceedings of the 57th Annual ACM Symposium on Theory of Computingen_US
dc.relation.isversionofhttps://doi.org/10.1145/3717823.3718242en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAssociation for Computing Machineryen_US
dc.titleFaster Rates for No-Regret Learning in General Games via Cautious Optimismen_US
dc.typeArticleen_US
dc.identifier.citationAshkan Soleymani, Georgios Piliouras, and Gabriele Farina. 2025. Faster Rates for No-Regret Learning in General Games via Cautious Optimism. In Proceedings of the 57th Annual ACM Symposium on Theory of Computing (STOC '25). Association for Computing Machinery, New York, NY, USA, 518–529.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.mitlicensePUBLISHER_POLICY
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2025-08-01T08:43:47Z
dc.language.rfc3066en
dc.rights.holderThe author(s)
dspace.date.submission2025-08-01T08:43:47Z
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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