Interferometric Deflection Analysis of Suspended 2D Polyaramid Thin Films

Abstract

The 2D nanofilm bulge test, which uses an Atomic Force Microscope (AFM) to measure the deflection of a suspended film under various conditions, has emerged as an important measurement platform for understanding mechanical, barrier, and permeability properties of 2D materials as thickness approaches the angstrom scale. The problem considered in this work is the limitation of such bulge analyses imposed by the AFM whereby dynamic measurements under high pressure, high temperature, and chemically corrosive conditions are limited. In this work, a technique is developed for measuring nanofilm deflection using only visible light interferometry. Both theoretical and semi‐empirical models are applied to translate multicolor interference patterns from broadband excitation into estimates of nano‐film deflection, allowing nanoscale precision in most cases. The technique and algorithm advanced in this work allows the use of widespread optical microscopy to widen the study of these important 2D nanofilm systems to more relevant conditions.