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dc.contributor.advisorHenry I. Smith.en_US
dc.contributor.authorEarly, Kathleenen_US
dc.date.accessioned2005-08-10T23:58:14Z
dc.date.available2005-08-10T23:58:14Z
dc.date.copyright1991en_US
dc.date.issued1991en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/13852
dc.descriptionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1991.en_US
dc.descriptionIncludes bibliographical references (leaves 179-187).en_US
dc.description.statementofresponsibilityby Kathleen Regina Early.en_US
dc.format.extent187 leavesen_US
dc.format.extent12734288 bytes
dc.format.extent12734046 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Scienceen_US
dc.titleExperimental characterization and physical modeling of resolution limits in proximity printing x-ray lithographyen_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc24652458en_US


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