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dc.contributor.advisorPeter Szolovits.en_US
dc.contributor.authorYu, Justin,M. Eng.(Justin K.)Massachusetts Institute of Technology.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2021-03-22T17:16:39Z
dc.date.available2021-03-22T17:16:39Z
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/130199
dc.descriptionThesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, May, 2020en_US
dc.description"May 2020." Date of graduation confirmed by MIT Registrar Office. Cataloged from student-submitted PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 49-50).en_US
dc.description.abstractImproper consumption of prescription opioids is a massive public health issue in the United States currently. Here, we propose one approach of tackling this issue through using machine learning techniques to predict opioid consumption post discharge for surgical patients. Through the data collected from surgical patients at BIDMC, relevant features will be identified and used to predict if patients high, outlier consumption. Using logistic regression and gradient boosted decision trees, model performance were evaluated at AUCs of 0.7270 and 0.7289 respectively.en_US
dc.description.statementofresponsibilityby Justin Yu.en_US
dc.format.extent50 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titlePredicting post-surgical opioid consumption using perioperative surgical dataen_US
dc.typeThesisen_US
dc.description.degreeM. Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1241197974en_US
dc.description.collectionM.Eng. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2021-03-22T17:16:07Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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