| 1 | Introduction: signals from electron-specimen interactions; electron detectors; scanning electron imaging (backscattered and secondary electron, BSE and SE); qualitative analysis using BSE imaging and energy dispersive spectrometry (EDS); introduction to X-ray mapping and semi-quantitative analysis | Course notes, pp. 3-7, 21-24, 35-36. |
| 2 | X-ray generation, emission, detection and measurement; wavelength dispersive spectrometer (WDS); analyzing crystals and proportional counters; WDS signal processing with single channel analyzer; compositional imaging (X-ray mapping) using WDS | Course notes, pp. 7-11, 24-34. |
| 3 | Quantitative analysis using WDS; sample preparation; carbon coating; peak and background in WD spectra; detector settings through pulse height analysis; peak overlap corrections | Course notes, pp. 35-41. |
| 4 | Matrix (ZAF) corrections in quantitative analysis; φ(ρz) corrections | Course notes, pp. 12-20. |
