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dc.contributorNelsen, Donald E. (Donald Edward)en_US
dc.date.accessioned2004-03-02T18:54:41Z
dc.date.available2004-03-02T18:54:41Z
dc.date.issued1967en_US
dc.identifier.other456en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/4287
dc.descriptionIssued also as a Ph.D. Thesis in the Dept. of Electrical Engineering, 1966.en_US
dc.descriptionBibliography: p.56.en_US
dc.format.extentiv, 56 p.en_US
dc.format.extent3670413 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMIT Research Laboratory of Electronicsen_US
dc.relation.ispartofseriesTechnical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 456.en_US
dc.subject.lccTK7855.M41 R43 no.456en_US
dc.subject.lcshTunnel diodesen_US
dc.subject.lcshElectronic circuitsen_US
dc.subject.lcshSwitching theoryen_US
dc.subject.lcshThreshold logicen_US
dc.titleStatistics of switching-time jitter for a tunnel diode threshold-crossing detector.en_US
dc.typeTechnical Report
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronics


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