MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • Research Laboratory for Electronics (RLE)
  • RLE Technical Reports
  • View Item
  • DSpace@MIT Home
  • Research Laboratory for Electronics (RLE)
  • RLE Technical Reports
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Statistics of switching-time jitter for a tunnel diode threshold-crossing detector.

Author(s)
Nelsen, Donald E. (Donald Edward)
Thumbnail
DownloadRLE-TR-456-04744903.pdf (3.500Mb)
Metadata
Show full item record
Description
Issued also as a Ph.D. Thesis in the Dept. of Electrical Engineering, 1966.
 
Bibliography: p.56.
 
Date issued
1967
URI
http://hdl.handle.net/1721.1/4287
Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
Publisher
MIT Research Laboratory of Electronics
Other identifiers
456
Series/Report no.
Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 456.

Collections
  • RLE Technical Reports

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.