Advanced Materials for Micro- and Nano-Systems (AMMNS): Recent submissions
Now showing items 97-99 of 122
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Observation of Joule Heating-Assisted Electromigration Failure Mechanisms for Dual Damascene Cu/SiO₂ Interconnects
(2003-01)Failure mechanisms observed in electromigration (EM) stressed dual damascene Cu/SiO₂ interconnects trees were studied and simulated. Failure sites with ‘melt patch’ or ‘crater’ are common for test structures in the top ... -
MOSFET Channel Engineering using Strained Si, SiGe, and Ge Channels
(2003-01)Biaxial tensile strained Si grown on SiGe virtual substrates will be incorporated into future generations of CMOS technology due to the lack of performance increase with scaling. Compressively strained Ge-rich alloys with ... -
Investigation on Aluminum-Based Amorphous Metallic Glass as New Anode Material in Lithium Ion Batteries
(2003-01)Aluminum based amorphous metallic glass powders were produced and tested as the anode materials for the lithium ion rechargeable batteries. Ground Al₈₀Ni₁₀La₁₀ was found to have a ...
