1/f noise in MOSFETs with ultrathin gate dielectrics
Author(s)
Gross, Blaine Jeffrey.![Thumbnail](/bitstream/handle/1721.1/13192/26680871-MIT.pdf.jpg?sequence=4&isAllowed=y)
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Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1992 Includes bibliographical references (p. 176-184).
Date issued
1992Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer SciencePublisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science