dc.contributor.advisor | James L. Kirtley, Jr. | en_US |
dc.contributor.author | Leeb, Steven B | en_US |
dc.date.accessioned | 2005-08-15T21:26:28Z | |
dc.date.available | 2005-08-15T21:26:28Z | |
dc.date.copyright | 1993 | en_US |
dc.date.issued | 1993 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/12607 | |
dc.description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1993. | en_US |
dc.description | Includes bibliographical references (leaves 152-162). | en_US |
dc.description.statementofresponsibility | by Steven Bruce Leeb. | en_US |
dc.format.extent | 222 leaves | en_US |
dc.format.extent | 16713302 bytes | |
dc.format.extent | 16713061 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
dc.subject | Electrical Engineering and Computer Science | en_US |
dc.title | A conjoint pattern recognition approach to nonintrusive load monitoring | en_US |
dc.type | Thesis | en_US |
dc.description.degree | Ph.D. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 28260591 | en_US |