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dc.contributor.authorDobrzeniecki, Andrew B. (Andrew Bruno)en_US
dc.contributor.authorYanch, Jacquelyn C.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Nuclear Engineeringen_US
dc.date.accessioned2014-09-16T23:38:20Z
dc.date.available2014-09-16T23:38:20Z
dc.date.issued1993en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/89751
dc.description"25 January 1993."en_US
dc.descriptionIncludes bibliographical references (pages 40-42)en_US
dc.description.abstractNuclear medicine imaging systems produce clinical images that are inherently noisier and of lower resolution than images from such modalities as MRI or CT. One method for improving our understanding of the factors that contribute to SPECT image degradation is to perform complete photon-level simulations of the entire imaging environment. We have designed such a system for SPECT simulation and modelling (SimSPECT), and have been using the system in a number of experiments aimed at improving the collection and analysis of SPECT images in the clinical setting. Based on Monte Carlo techniques, Sim- SPECT realistically simulates the transport of photons through asymmetric, 3-D patient or phantom models, and allows photons to interact with a number of different types of collimators before being collected into synthetic SPECT images. We describe the design and use of SimSPECT, including the computational algorithms involved, and the data visualization and analysis methods employed.en_US
dc.format.extent42 pagesen_US
dc.publisherCambridge, Mass. : Massachusetts Institute of Technology, Dept. of Nuclear Engineering, [1993]en_US
dc.relation.ispartofseriesMITNE ; no. 301en_US
dc.subject.lccTK9008.M41 N96 no.301en_US
dc.subject.lcshSingle-photon emission computed tomographyen_US
dc.subject.lcshDiagnostic imagingen_US
dc.subject.lcshMonte Carlo methoden_US
dc.titleComputational and visualization techniques for Monte Carlo based SPECTen_US
dc.title.alternativeMonte Carlo based Single Photon Emission Computed Tomographyen_US
dc.typeTechnical Reporten_US
dc.identifier.oclc857793736en_US


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