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dc.contributor.authorMcMillan, Roberten_US
dc.contributor.authorMikic, B. B.en_US
dc.contributor.otherMassachusetts Institute of Technology. Division of Sponsored Research.en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Mechanical Engineering.en_US
dc.contributor.otherMassachusetts Institute of Technology. Heat Transfer Laboratory.en_US
dc.date.accessioned2011-03-04T23:30:55Z
dc.date.available2011-03-04T23:30:55Z
dc.date.issued1970en_US
dc.identifier14090021en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/61461
dc.description.abstractThis work considers the effect of roughness and waviness on interfacial pressure distributions and interfacial contact resistance. It is shown that for moderate roughness the contour area could be substantially different from the contour area calculated using the Hertzian theory. The model for pressure calculation assumes plastic deformation of surface irregularities and elastic deformation of a spherically wavy base. The calculations of pressure distributions cover the range of parameters of practical interest. Experimental contact resistance values have been determined and are compared with theoretical predictions. It was calculated that contact conductance for wavy surfaces can be increased for certain ranges of parameters by making surfaces rough.en_US
dc.description.sponsorshipNASA DSR Projecten_US
dc.format.extent99 pen_US
dc.publisherCambridge, Mass. : M.I.T. Engineering Projects Laboratory, [1970]en_US
dc.relation.ispartofseriesTechnical report (Massachusetts Institute of Technology, Heat Transfer Laboratory) ; no. 70.en_US
dc.subjectThermal analysis.en_US
dc.subjectSurfaces (Technology)en_US
dc.titleThermal contact resistance with non-uniform interface pressuresen_US
dc.typeTechnical Reporten_US


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