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dc.contributor.authorBerker, A. Nihaten_US
dc.contributor.authorAalberts, Daniel P.en_US
dc.contributor.authorFalicov, Alexisen_US
dc.contributor.authorHoston, William C., Jr.en_US
dc.contributor.authorNetz, Roland R.en_US
dc.contributor.authorAriel, Imadielen_US
dc.date.accessioned2010-07-16T04:19:51Z
dc.date.available2010-07-16T04:19:51Z
dc.date.issued1990-01-01 to 1990-12-31en_US
dc.identifierRLE_PR_133_01_03s_01en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57147
dc.descriptionContains introduction and reports on four research projects.en_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAAL03-89-C-0001en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1990en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofSurfaces and Interfacesen_US
dc.relation.ispartofStatistical Mechanics of Surface Systems and Quantum-Correlated Systemsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 133en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherStatistical Mechanics of Surface Systemsen_US
dc.subject.otherStatistical Mechanics of Quantum-Correlated Systemsen_US
dc.subject.otherFinite-Temperature Properties of Vicinal Si(100) Surfacesen_US
dc.subject.otherImpurity-Induced Critical Behavioren_US
dc.subject.otherMonte Carlo Mean-Field Theory in Two Dimensionen_US
dc.subject.otherMonte Carlo Mean-Field Frustrated Systems in Two Dimensionen_US
dc.subject.otherMonte Carlo Mean-Field Theory in Three Dimensionen_US
dc.subject.otherMonte Carlo Mean-Field Frustrated Systems in Three Dimensionen_US
dc.subject.otherQuantum Systemsen_US
dc.titleStatistical Mechanics of Surface Systems and Quantum-Correlated Systemsen_US
dc.typeTechnical Reporten_US


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