| dc.contributor.author | Halle, Morris | en_US |
| dc.contributor.author | Chomsky, A. Noam | en_US |
| dc.contributor.author | Abney, Steven Paul | en_US |
| dc.contributor.author | Browning, Marguerite | en_US |
| dc.contributor.author | Cole, Jennifer Sandra | en_US |
| dc.contributor.author | Lumsden, John Stewart | en_US |
| dc.contributor.author | Rapoport, Tova Rebecca | en_US |
| dc.contributor.author | Shlonsky, Ur | en_US |
| dc.contributor.author | Tenny, Carol Tee | en_US |
| dc.date.accessioned | 2010-07-16T03:48:47Z | |
| dc.date.available | 2010-07-16T03:48:47Z | |
| dc.date.issued | 1987-01-01 to 1987-12-31 | en_US |
| dc.identifier | RLE_PR_130_17 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/57033 | |
| dc.description | Contains report on one research project and abstracts for seven theses. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1987 | en_US |
| dc.relation.ispartof | Linguistics | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 130 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Linguistics | en_US |
| dc.subject.other | The English Noun Phrase in its Sentential Aspect | en_US |
| dc.subject.other | Null Operator Constructions | en_US |
| dc.subject.other | Planar Phonology and Morphology | en_US |
| dc.subject.other | Syntactic Features: Parametric Variation in the History of English | en_US |
| dc.subject.other | Copular, Nominal and Small Clauses: a Study of Israeli Hebrew | en_US |
| dc.subject.other | Null and Displaced Subjects | en_US |
| dc.subject.other | Grammaticalizing Aspect and Affectedness | en_US |
| dc.title | Linguistics | en_US |
| dc.type | Technical Report | en_US |
