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dc.contributor.authorEzekiel, Shaoulen_US
dc.contributor.authorHackel, Lloyd A.en_US
dc.contributor.authorYoumans, Douglas G.en_US
dc.contributor.authorGrove, Robert E.en_US
dc.contributor.authorWu, Frederick Y-F.en_US
dc.contributor.authorMiller, John L.en_US
dc.contributor.authorRoss, Arthur H. M.en_US
dc.contributor.authorGeorge, E. Victoren_US
dc.contributor.authorWerner, Charles W.en_US
dc.contributor.authorHoff, Paul W.en_US
dc.contributor.authorRhodes, Charles K.en_US
dc.contributor.authorHaus, Hermann A.en_US
dc.contributor.authorAusschnitt, Christopher P.en_US
dc.contributor.authorHagelstein, Peter L.en_US
dc.date.accessioned2010-07-15T02:29:07Z
dc.date.available2010-07-15T02:29:07Z
dc.date.issued1974-07-15en_US
dc.identifierRLE_QPR_114_Ven_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56495
dc.descriptionContains reports on three research projects.en_US
dc.description.sponsorshipU. S. Air Force Office of Scientific Research (Contract F44620-71-C-0051)en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAAB07-71-C-0300)en_US
dc.description.sponsorshipUniversity of California, Livermore (Subcontract No. 7877409)en_US
dc.description.sponsorshipU. S. Army Research Office - Durham (Contract DAHC04-72-C-0044)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, July 15, 1974en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofQuantum Electronicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 114en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherQuantum Electronicsen_US
dc.subject.otherLaser Applicationsen_US
dc.subject.otherGaseous Lasersen_US
dc.subject.otherNonlinear Phenomenaen_US
dc.titleQuantum Electronicsen_US
dc.typeTechnical Reporten_US


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