| dc.contributor.author | Weaver, James C. | en_US |
| dc.date.accessioned | 2010-07-15T00:02:05Z | |
| dc.date.available | 2010-07-15T00:02:05Z | |
| dc.date.issued | 1974-04-15 | en_US |
| dc.identifier | RLE_QPR_113_I | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/56468 | |
| dc.description | Contains reports on one research project. | en_US |
| dc.description.sponsorship | Joint Services Electronics Program (Contract DAAB07-71-C-0300) | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1974 | en_US |
| dc.relation.ispartof | General Physics | en_US |
| dc.relation.ispartof | Molecule Microscopy | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 113 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Molecule Microscopy | en_US |
| dc.subject.other | Factors Affecting Resolution of Scanning Desorption Molecule Microscopy | en_US |
| dc.title | Molecule Microscopy | en_US |
| dc.type | Technical Report | en_US |
