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dc.contributor.authorAdler, Richard B.en_US
dc.contributor.authorGupta, Madhu S.en_US
dc.contributor.authorKyhl, Robert L.en_US
dc.contributor.authorPenfield, Paul L., Jr.en_US
dc.contributor.authorStaelin, David H.en_US
dc.contributor.authorBurke, Bernard F.en_US
dc.date.accessioned2010-07-14T22:27:14Z
dc.date.available2010-07-14T22:27:14Z
dc.date.issued1974-01-15en_US
dc.identifierRLE_QPR_112_VIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56449
dc.descriptionContains research objectives and summary of research.en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAAB07-71-C-0300)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1974en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofMicrowave and Millimeter Wave Techniquesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 112en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherMicrowave and Millimeter Wave Techniquesen_US
dc.subject.otherLow-Temperature Millimeter Wave Receiversen_US
dc.subject.otherMicrowave Measurements and Instrumentationen_US
dc.subject.otherVery Long Baseline Interferometryen_US
dc.titleMicrowave and Millimeter Wave Techniquesen_US
dc.typeTechnical Reporten_US


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