| dc.contributor.author | Chatterjee, Nilanjan | |
| dc.contributor.author | Grove, Timothy L. | |
| dc.coverage.temporal | January (IAP) 2006 | |
| dc.date.accessioned | 2010-06-09T10:41:34Z | |
| dc.date.available | 2010-06-09T10:41:34Z | |
| dc.date.issued | 2006-01 | |
| dc.identifier | 12.141-January(IAP)2006 | |
| dc.identifier.other | 12.141 | |
| dc.identifier.other | IMSCP-MD5-aae8a5fa8b0e9fb0df31bfa0239f5ac0 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/55816 | |
| dc.description.abstract | Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe. From the course home page: Course Description This lab-oriented course introduces the student to the subject of X-ray spectrometry and micro-scale chemical quantitative analysis of solid samples through an intensive series of hands-on laboratory exercises that use the electron microprobe. | en |
| dc.language.iso | en-US | |
| dc.relation.isbasedon | http://hdl.handle.net/1721.1/35789 | |
| dc.relation.isbasedon | http://mit-ocw.sbu.ac.ir/Default.aspx?tabid=4274 | |
| dc.rights | This site (c) Massachusetts Institute of Technology 2010. Content within individual courses is (c) by the individual authors unless otherwise noted. The Massachusetts Institute of Technology is providing this Work (as defined below) under the terms of this Creative Commons public license ("CCPL" or "license") unless otherwise noted. The Work is protected by copyright and/or other applicable law. Any use of the work other than as authorized under this license is prohibited. By exercising any of the rights to the Work provided here, You (as defined below) accept and agree to be bound by the terms of this license. The Licensor, the Massachusetts Institute of Technology, grants You the rights contained here in consideration of Your acceptance of such terms and conditions. | en |
| dc.subject | x-ray microanalysis | en |
| dc.subject | electron microprobe | en |
| dc.subject | ZAF matrix corrections | en |
| dc.subject | wavelength and energy dispersive spectrometry | en |
| dc.subject | scanning backscattered electron | en |
| dc.subject | secondary electron | en |
| dc.subject | cathodoluminescence | en |
| dc.subject | and X-ray imaging | en |
| dc.title | 12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry, January (IAP) 2006 | en |
| dc.title.alternative | Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry | en |
| dc.audience.educationlevel | Graduate | |
| dc.audience.educationlevel | Undergraduate | |
| dc.subject.cip | 400601 | en |
| dc.subject.cip | Geology/Earth Science, General | en |
| dc.subject.cip | 400502 | en |
| dc.subject.cip | Analytical Chemistry | en |
