dc.contributor.author | Eberle, F. W. | en_US |
dc.contributor.author | Gadzuk, J. W. | en_US |
dc.contributor.author | Fehrs, D. L. | en_US |
dc.contributor.author | Greaves, W. | en_US |
dc.date.accessioned | 2010-06-07T19:03:36Z | |
dc.date.available | 2010-06-07T19:03:36Z | |
dc.date.issued | 1967-07-15 | en_US |
dc.identifier | RLE_QPR_086_IX | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/55624 | |
dc.description | Contains reports on four research projects. | en_US |
dc.description.sponsorship | National Aeronautics and Space Administration (Grant NGR-22-009-091) | en_US |
dc.description.sponsorship | M.I.T. Cabot Solar Energy Fund | en_US |
dc.description.sponsorship | Joint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DA 28-043-AMC-02536(E) | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, July 15, 1967 | en_US |
dc.relation.ispartof | General Physics | en_US |
dc.relation.ispartof | Physical Electronics and Surface Physics | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 86 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Physical Electronics | en_US |
dc.subject.other | Surface Physics | en_US |
dc.subject.other | Desorption, Dissociation, and Recombination of Halogen Gases on Metal Surfaces | en_US |
dc.subject.other | Screening of a Point Impurity in the Surface Region of an Electron Gas | en_US |
dc.subject.other | Contact-Potential Measurements of the Adsorption of Nitrogen on (110) Tantalum | en_US |
dc.subject.other | Thermionic and Adsorption Properties of Polycrystalline Refractory Metals Exposed to Oxygen | en_US |
dc.title | Physical Electronics and Surface Physics | en_US |
dc.type | Technical Report | en_US |