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dc.contributor.authorMueller, Peter
dc.coverage.temporalSpring 2008
dc.date.accessioned2010-05-06T09:43:28Z
dc.date.available2010-05-06T09:43:28Z
dc.date.issued2008-06
dc.identifier5.069-Spring2008
dc.identifier.other5.069
dc.identifier.otherIMSCP-MD5-67b8ece6774956b8e0064f29866b4ffe
dc.identifier.urihttp://hdl.handle.net/1721.1/54727
dc.description.abstractThis course covers the following topics: X-ray diffraction: symmetry, space groups, geometry of diffraction, structure factors, phase problem, direct methods, Patterson methods, electron density maps, structure refinement, how to grow good crystals, powder methods, limits of X-ray diffraction methods, and structure data bases.en
dc.language.isoen-US
dc.relation.hasversionhttp://hdl.handle.net/1721.1/45590
dc.relation.hasversionhttp://www.core.org.cn/OcwWeb/Chemistry/5-068Spring-2005/CourseHome/index.htm
dc.rightsThis site (c) Massachusetts Institute of Technology 2003. Content within individual courses is (c) by the individual authors unless otherwise noted. The Massachusetts Institute of Technology is providing this Work (as defined below) under the terms of this Creative Commons public license ("CCPL" or "license"). The Work is protected by copyright and/or other applicable law. Any use of the work other than as authorized under this license is prohibited. By exercising any of the rights to the Work provided here, You (as defined below) accept and agree to be bound by the terms of this license. The Licensor, the Massachusetts Institute of Technology, grants You the rights contained here in consideration of Your acceptance of such terms and conditions.en
dc.subjectcrystallographyen
dc.subjectinorganic chemistryen
dc.subjectphysical methodsen
dc.subjectcrystal structure determinationen
dc.subject3D structureen
dc.subjectx-ray crystallagraphyen
dc.subjectdiffractionen
dc.subjectx-raysen
dc.subjectsymmetryen
dc.subjectphasingen
dc.subjectcrystal structureen
dc.subjectsymmetry operationsen
dc.subjectcrystal latticeen
dc.subjectstructure refinementen
dc.subjectelectron density mapsen
dc.subjectspace group determinationen
dc.subjectphasingen
dc.subjectanomalous scatteringen
dc.title5.069 Crystal Structure Analysis, Spring 2008en
dc.title.alternativeCrystal Structure Analysisen
dc.typeLearning Object
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistry
dc.audience.educationlevelGraduate
dc.subject.cip400503en
dc.subject.cipInorganic Chemistryen
dc.subject.cip400502en
dc.subject.cipAnalytical Chemistryen
dc.subject.cip400808en
dc.subject.cipSolid State and Low-Temperature Physicsen


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