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dc.contributor.authorPoeltinger, A.en_US
dc.contributor.authorRook, C. W., Jr.en_US
dc.date.accessioned2010-04-09T19:35:39Z
dc.date.available2010-04-09T19:35:39Z
dc.date.issued1962-04-15en_US
dc.identifierRLE_QPR_065_VIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/53686
dc.descriptionContains reports on two research projects.en_US
dc.description.sponsorshipUnited States Navy, Office of Naval Research (Contract Nonr-1841(49))en_US
dc.description.sponsorshipLincoln Laboratory (Purchase Order DDL B-00337)en_US
dc.description.sponsorshipUnited States Armyen_US
dc.description.sponsorshipUnited States Navyen_US
dc.description.sponsorshipUnited States Air Force (Contract AF19(604)-7400)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1962en_US
dc.relation.ispartofMicrowave Electronicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 65en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherMicrowave Electronicsen_US
dc.subject.otherHigh-Perveance Hollow Electron-Beam Studyen_US
dc.subject.otherApproximate Technique for Evaluation of Electronic Loading in a Klystron Gap in the Presence of a Potential Depressionen_US
dc.titleMicrowave Electronicsen_US
dc.typeTechnical Reporten_US


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