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dc.contributor.authorChevalier, Philippe B.en_US
dc.contributor.authorWein, Lawrence M.en_US
dc.date.accessioned2009-10-02T13:54:50Z
dc.date.available2009-10-02T13:54:50Z
dc.date.issueden_US
dc.identifierinspectionforcir00cheven_US
dc.identifier.urihttp://hdl.handle.net/1721.1/48235
dc.publisherCambridge, Mass. : Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992en_US
dc.relation.ispartofseriesWorking paper (Sloan School of Management) ; 3465.en_US
dc.titleInspection for circuit board assemblyen_US
dc.typeWorking Paperen_US
dc.identifier.oclc26970409en_US
dc.identifier.aleph000630572en_US


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