Innovation in Manufacturing Systems and Technology (IMST): Recent submissions

Now showing items 58-60 of 108

    • Atomic Force Microscope: Modeling, Simulations, and Experiments 

      El Rifai, Osamah M.; Youcef-Toumi, Kamal (2002-01)
      The quality of atomic force microscope (AFM) data strongly depends on scan and controller parameters. Data artifacts can result from poor dynamic response of the instrument. In order to achieve reliable data, dynamic ...

    • Application of Stereo Imaging to Atomic Force Microscopy 

      Aumond, Bernardo D.; Youcef-Toumi, Kamal (2002-01)
      Metrological data from sample surfaces can be obtained by using a variety of profilometry methods. Atomic Force Microscopy (AFM), which relies on contact inter-atomic forces to extract topographical images of a sample, ...

    • 2.5 D Cavity Balancing 

      Jin, S.; Lam, Yee Cheong (2002-01)
      Cavity balancing is the process of altering the flow front within a cavity through thickness and design changes such that the desired fill pattern is achieved. The 2 dimensional (2D) cavity-balancing algorithm, developed ...