| dc.contributor | Finan, William F | en_US |
| dc.contributor.other | MIT Japan Program. | en_US |
| dc.date.accessioned | 2005-06-01T15:20:05Z | |
| dc.date.available | 2005-06-01T15:20:05Z | |
| dc.date.issued | 1993 | en_US |
| dc.identifier.other | 93-01 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/17109 | |
| dc.description | Includes bibliographical references. | en_US |
| dc.description.statementofresponsibility | William F. Finan. | en_US |
| dc.format.extent | 31 p. | en_US |
| dc.format.extent | 2480874 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | MIT Japan Program, Massachusetts Institute of Technology | en_US |
| dc.relation.ispartofseries | MITJP (Series) ; 93-01. | en_US |
| dc.subject.lcc | Q180.J3 M22 no.93-01 | en_US |
| dc.title | Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan | en_US |
