Computational metrology for materials
Author(s)
Warren, James; Read, Jake; Seppala, Jonathan; Strand, Erik; Gershenfeld, Neil
Download43578_2025_Article_1651.pdf (1.456Mb)
Publisher with Creative Commons License
Publisher with Creative Commons License
Creative Commons Attribution
Terms of use
Metadata
Show full item recordAbstract
Advanced materials hold great promise, but their adoption is impeded by the challenges of developing, characterizing, and modeling them, then of designing, processing, and producing something with them. Even if the results are open, the means to do each of these steps are typically proprietary and segregated. We show how principles of open-source software and hardware can be used to develop open instrumentation for materials science, so that a measurement can be accompanied by a complete computational description of how to reproduce it. And then we show how this approach can be extended to effectively measure predictive computational models rather than just model parameters. We refer to these interrelated concepts as “computational metrology.” These are illustrated with examples including a 3D printer that can do rheological characterization of unfamiliar and variable materials.
Date issued
2025-07-31Department
Massachusetts Institute of Technology. Center for Bits and AtomsJournal
Journal of Materials Research
Publisher
Springer International Publishing
Citation
Warren, J., Read, J., Seppala, J. et al. Computational metrology for materials. J. Mater. Res. 40, 2197–2203 (2025).
Version: Final published version